常用的薄窗粒子探测器,薄窗厚度一般为上百微克/厘米~2,而穿透式薄膜闪烁计数器及穿透式薄膜半导体探测器,物质总厚度至少都在1毫克/厘米~2左右。它们尚不能满足一些物理实验的要求,例如要求入射粒子能量损失非常小的实验、要求记录能量极低粒子的实验,等等。 Commonly used thin window detector, the thin window thickness is generally 100 micrograms / cm ~ 2, and the transmissive thin film scintillation counter and penetrating thin film semiconductor detector, the total material thickness of at least 1 mg / cm ~ 2 or so . They can not meet the requirements of some physical experiments, for example, experiments requiring very little energy loss of incident particles, experiments requiring recording of extremely low energy particles, and the like.