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电荷耦合器件(CCD)基本性质的许多应用是探测最小电荷量。特殊电荷注入法和埋沟的采用、最佳时钟频率的选择、相关双取样的应用(DCS)等等能降低CCD寄存器中的噪声。这样,寄存器输出放大器中的噪声就成了决定因素,它主要是由与CCD同片的FET沟道热噪声引起的电动势决定的。使用这种晶体管的放大器可提供探测50—100个电子。通过使用分布浮置栅放大器(FGDA)能减少这种噪声的影响,这里由于使用n个平行级,能增加信/噪比n~(1/2)。使用FGDA可检测出非常小的电荷(10—20
Many applications of the basic properties of charge coupled devices (CCDs) are to detect the minimum amount of charge. The use of special charge injection and buried ditch, the choice of the best clock frequency, the application of correlated double sampling (DCS) and so on can reduce the noise in the CCD register. Thus, the noise in the register output amplifier becomes the deciding factor, which is mainly determined by the electromotive force caused by the FET channel thermal noise in the same chip as the CCD. Amplifiers using this transistor provide detection of 50-100 electrons. The effect of this noise can be reduced by using a distributed floating gate amplifier (FGDA), where n ~ (1/2) can be increased by using n parallel stages. Use FGDA can detect very small charge (10-20