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1979年12月14日至15日在沈阳召开了JPG-Ⅰ型激光平面干涉仪鉴定会。该仪器是由沈阳仪器仪表工艺研究所、上海光学精密机械研究所共同研制的。会议由国家仪器仪表工业总局委托沈阳仪器仪表工艺研究所主持。参加会议的有辽宁省计量局、沈阳市科学技术委员会、上海光学仪器厂等有关生产、科研和高等院校共18个单位,20余名代表。会议听取了两个研制单位所作的研制报告和φ250平面干涉仪光学工艺与测试等技术报告。代表们对该仪器进行了现场测试,对图纸资料进行了审查。代表们一致认为:一、该仪器的光学和机械设计合理,达到了设计任务书中提出的各项指标。测量范围:能测量φ230毫米的视场;
December 1979 December 15 to 15 in Shenyang held a JPG-Ⅰ laser plane interferometer identification will. The instrument is from Shenyang Institute of Instrumentation Technology, Shanghai Institute of Optics and Fine Mechanics jointly developed. The meeting was entrusted by the State Instrument and Meter General Administration of Industry and Engineering instrumentation Shenyang Institute. Attended the meeting are Liaoning Province Bureau of Metrology, Shenyang Science and Technology Commission, Shanghai Optical Instrument Factory and other relevant production, research and institutions of higher learning a total of 18 units, more than 20 representatives. The meeting listened to the research report made by the two research institutes and the technical report on the φ250 plane interferometer optical technology and testing. The representatives of the instrument conducted a field test, the drawings and materials were reviewed. The delegates agreed that: First, the optical and mechanical design of the instrument is reasonable and has reached the targets set forth in the design mission statement. Measuring range: can measure φ230 mm field of view;