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采用Bridgman法生长了二氧化碲(TeO2)晶体,运用光学显微镜、电子衍射光谱、化学腐蚀等方法分析了该方法生长TeO2晶体内部的缺陷。初步讨论了散射点、微裂纹、气泡和黑点、条纹以及腐蚀坑等微缺陷的形成机理。结果表明:晶体内部的散射点来自于原料中杂质,条纹主要是由于晶体内应力引起,晶体内的气泡和黑点和晶体生长的温度密切相关,并就如何减少这些微缺陷进行了初步探讨。
The crystal of tellurium dioxide (TeO2) was grown by Bridgman method. The defects of TeO2 crystal grown by this method were analyzed by optical microscope, electron diffraction and chemical etching. The forming mechanism of micro-defects such as scattering point, microcracks, bubbles and black spots, stripes and corrosion pits are discussed preliminarily. The results show that the scattering point in the crystal comes from the impurities in the raw materials. The fringes are mainly caused by the stress in the crystal. The bubbles and black spots in the crystal are closely related to the temperature of crystal growth. The micro-defects are also discussed.