模拟集成电路的复杂性和制造密度的提高,使得电路的测试成为一个重要同时又是困难的任务,传统的模拟电路的测试,被局限在外接一定数目的测试脚这种方式上。一种称为BIST结构的方法则完全不同,它不仅有着可控性、易于观测的特点,而且较之以前所报道过的方法,明显降低了电路测试的硬件费用。这种结构也同样适用于数字电路,并且适用于自动地插入电路进行测试。 The complexity of analog integrated circuits and the increase of manufacturing density make the testing of circuits an important but difficult task. The testing of traditional analog circuits is limited to the way of connecting a certain number of test pins. A completely different approach, known as BIST architecture, is not only controllable and easy to observe, but also significantly reduces the hardware cost of circuit testing over previously reported methods. This structure is equally applicable to digital circuits, and is suitable for automatic insertion into the circuit for testing.