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自反射是低温致冷探测器阵列自身象的一种组合,是扫描热成象系统中独有的一种效应,当探测器敏感到通过透镜表面反射,而达到其上面的背景辐射量的变化时,就会发生这种现象。根据拉格朗日不变量,结合系统光谱响应推导出的旁轴表面公式,用其等效景物温差(NARC△T)来确定自反射效应。依据起作用表面的旁轴光线数据,方程式给出这种自反射叠影的强度和大小。这种高斯公式有足够的测辐射精度,因此不必做大量的光线追迹。
Self-reflection is a combination of self-reflection of a cryogenically cooled detector array that is unique to a scanning thermal imaging system. When the detector is sensitive to changes in the amount of background radiation reflected through the lens surface, When this happens. Based on the Lagrange invariant, the paraxial surface formula deduced from the spectral response of the system is used to determine the self-reflection effect with its equivalent temperature difference (NARC △ T). Based on the paraxial ray data of the active surface, the equation gives the intensity and size of this self-reflecting ghost image. This Gaussian formula has sufficient radiation accuracy, so do not have to do a lot of ray tracing.