相变存储器单元的测试主要包括set、reset和read操作,目前国内外多采用施加电压脉冲的方法对相变存储单元进行reset操作,这不仅容易造成器件的损坏,而且使得相变过程中瞬态电流的准确计算非常困难。与常规测试方法不同,文章提出一种专门针对相变存储器的电流脉冲测试系统,该系统可以提供准确可控的电流脉冲来对相变存储器器件单元进行操作。 Testing of phase change memory cells mainly includes set, reset, and read operations. At present, many methods of applying voltage pulses at home and abroad are resetting phase change memory cells, which not only easily cause damage to the device, but also make the phase transition transient Accurate calculation of current is very difficult. In contrast to the conventional test methods, the paper proposes a current-pulse test system specifically designed for phase-change memory that provides accurate and controllable current pulses to operate phase-change memory device cells.