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分析了实现磁光盘载噪比CNR指标自动化测试的障碍和谱信号的特性，针对CNR测试中存在的特殊性，即测试精度依赖于对载波频率处的信号谱幅值和噪声谱幅值的测量误差，而与两者出现的时间无关．提出单轴等时间测试方法，最大限度地利用8098微控制器的内部资源，在保证测试精度足够的基础上实现了数据采集电路结构最简．
The characteristics of obstacle and spectrum signal to realize CNR index automation testing of magneto-optical disk are analyzed. According to the particularity of CNR test, the test accuracy depends on the measurement of signal spectrum amplitude and noise spectrum amplitude at carrier frequency Error, but not with the time of both. A single-axis equal-time test method is proposed to maximize the internal resources of the 8098 microcontroller. The data acquisition circuit structure is the simplest with sufficient test accuracy.