对材料作显微观察分析时,需要对材料表面腐蚀或将材料减簿.因为腐蚀之后所显示的腐蚀图象,在一定程度上反应材料的组织和结构.在用透射电子显微镜观察材料内部组织和结构时,需要将材料减薄,制成数千埃至数万埃厚度的薄样品.近年来常用离子轰击方法腐蚀或减薄样品,离子轰击减薄 Microscopic observation and analysis of the material requires that the surface of the material be etched or the material be reduced in size because of the corrosion pattern displayed after the etching, to a certain extent, the structure and the structure of the material are reacted.Using a transmission electron microscope to observe the internal structure of the material And structure, the material needs to be thinned to make thin samples ranging from several thousand angstroms to tens of thousands angstroms.In recent years, ion bombardment methods have been used to etch or thin the samples, ion bombardment thinning