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采用‘分割光束’的方法模拟计算了光子扫描隧道显微镜样品表面近场光强。用平面波对一维结构光盘进行的初步计算结果表明其表面近场光强分布相当复杂，一般情况下近场光强分布并不能真实地描述表面结构，近场光强受到表面结构很强的调制。当针尖与样品间距增大时，光强分布上会迭加上一些微小的波动。光强分布和样品表面结构之间会产生位移，这可能影响利用扫描近场光学显微镜进行纳米加工和定位。将数值计算结果与他人的实验结果进行了比较。
The “split beam” method was used to simulate the near field intensity of photon-scanning tunneling microscope. The preliminary calculation results of the one-dimensionally structured optical disc by plane wave show that the near-surface light intensity distribution on the surface is rather complicated. Under normal circumstances, the near-field light intensity distribution does not describe the surface structure truly and the near-field light intensity is strongly modulated by the surface structure . When the distance between the needle tip and the sample is increased, some slight fluctuations are added to the light intensity distribution. Displacement between the light intensity distribution and the surface structure of the sample can affect the nanofabrication and positioning using scanning near-field optical microscopy. The numerical results are compared with the experimental results of others.