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提出一种新的基于扫描线算法的ＩＣ版图几何设计规则检查方法．根据各类设计规则检查（ＤＲＣ）命令对运算边对的要求及检查值，选择保留适当的旧扫描线及其部分矢量，建立相应的数据结构和检索策略，实现在一次扫描中同时完成ｘ、ｙ方向的检查，冗余工作大大减少．采用的算法和数据结构适宜于将数据分段处理，便于使用内、外存数据交换方式，以降低对内存的要求，适宜于检查ＶＬＳＩ版图．
A new inspection method of IC layout geometric design rules based on scan line algorithm is proposed. According to the requirements of all kinds of design rule check (DRC) commands and checking values, we choose to retain the appropriate old scan lines and some of their vectors, and establish the corresponding data structure and retrieval strategy to achieve the simultaneous completion of x, y direction of inspection, redundant work greatly reduced. The algorithm and data structure used are suitable for segmenting the data, facilitating the use of internal and external data exchange methods to reduce the memory requirements and are suitable for checking the VLSI layout.