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高纯Z_nSO_4和Z_nS中痕量Pb及Cu杂质的测定,以前多用比色法、方波极谱或原子吸收法。这些方法,有的操作手续较繁,有的设备昂贵,不便于广泛使用。我们为了配合校化工厂荧光粉研制需要,曾试验应用玻碳电极汞膜伏安法测定高纯ZnSO_4和ZnS中痕量Pb和Cu杂质,取得了较满意的结果。实验证明,在0.5NHCl底液中,Pb~(++)和Cu~(++)的浓度在10~(-6)—10~(-8)M范围内,其溶出峰高与浓度成正比。回收率的相对误差和样品中杂质测定的相对误差都在6%以下。方法灵敏、简便、快速。
Determination of Trace Pb and Cu Impurities in High Purity Z_nSO_4 and Z_nS, Previous Multipurpose Colorimetry, Square Wave Polarography or AAS. These methods, some of the more complicated procedures, and some expensive equipment, not easy to widely used. In order to meet the needs of the Phosphors for chemical plants, we have experimented on the determination of trace Pb and Cu impurities in high purity ZnSO_4 and ZnS by mercury vapor voltammetry with glassy carbon electrode. The results were satisfactory. Experiments show that the concentration of Pb ~ (++) and Cu ~ (++) in the range of 10 ~ (-6) -10 ~ (-8) M in 0.5NHCl solution has a Is proportional. The relative error of the recovery and the relative error in the measurement of impurities in the sample are all below 6%. The method is sensitive, simple and fast.