前言 晶体缺陷的研究目前已经突破范性形变这一传统领域,渗透到金属、固体电磁性能方面,但它的测量方法始终在探讨,主要的常用方法有金相显微镜及X射线法。近年来采用电子显微镜,不仅可测位错密度,且能直接观察缺陷的形态。但存在的共同问题是这些方法均受到试样制备的限制,而且试样表面位错密度与体内有差异,尤其是当缺 Preface The study of crystal defects has now broken through the traditional field of the norm deformation, penetrating into the electromagnetic properties of metals and solids. However, its measurement methods are always discussed. The main commonly used methods are the metallographic microscope and the X-ray method. In recent years, the use of electron microscopy, not only dislocation density can be measured, and can directly observe the defect morphology. However, the common problem is that these methods are limited by sample preparation, and the dislocation density on the surface of the sample is different from that in the body,