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十、集成运放在测量电路中的应用集成运放近于理想的输入特性、阻抗变换特性、对电源电压变化的隔离特性以及强有力的闭环控制特性,将使它在许多情况下可以很方便地实现对多种参数的精确测量。在这一讲中,我们将扼要介绍怎样有效地利用集成运放来进行下列参量的测量:1.常用的电与非电参量的测量。其中包括微电流、微电压、高压、峰值电压、电荷量、相位、温度以及应变等参量的测量。2.晶体管直流及低频参数的测量。其中包括:双极型晶体管的β、I_(CEO)、BV_(CEO)以及输出电导g_0等参数的测量;
Ten, the integrated operational amplifier in the measurement circuit The integrated operational amplifier near the ideal input characteristics, impedance conversion characteristics of the power supply voltage change isolation and strong closed-loop control characteristics will make it in many cases can be very convenient To achieve accurate measurement of a variety of parameters. In this lecture, we will briefly introduce how to effectively use the integrated op amp to measure the following parameters: 1. Commonly used measurement of electrical and non-electrical parameters. Including micro-current, micro-voltage, high voltage, peak voltage, charge, phase, temperature and strain and other parameters of the measurement. 2. Transistor DC and low frequency parameters of the measurement. Including: Bipolar transistor β, I_ (CEO), BV_ (CEO) and the output conductance g_0 and other parameters of the measurement;