本文叙述了美国国防部采购可靠半导体器件所使用的标准化和规范方法。在这篇文章中简短介绍了背景,并合理地引用了当前的方法和以此为基础的若干经验等。总结了有关可靠性研究和为有效实现这些方法所必需的其他一些工作。这些研究所讨论的重点是一些失效形式和失效机构的识别,以及这些资料在元件规范、技术鉴定、可靠性试验和可靠性予测中的使用。讨论的重点放在微电子学元件可靠性问题上。 This article describes the standardized and standardized methods used by the U.S. Department of Defense for procuring reliable semiconductor devices. In this article, we briefly introduce the background and cite the current methodology and some of the experiences based on it. Summarizes the reliability studies and other work necessary to effectively implement these methods. The focus of these studies is the identification of some forms of failure and failure mechanisms, as well as the use of these materials in component specifications, technical appraisals, reliability tests, and reliability predictions. The discussion focused on the reliability of microelectronic components.