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本文提出试验设备的使用环境温度宜从5℃～40℃较宽的范围缩减到25±3℃的范围内,以利于设备的设计、制造以及保证设备试验结果的精确。
This paper proposes that the ambient temperature of the test equipment should be reduced from a wide range of 5 ℃ ~ 40 ℃ to 25 ± 3 ℃ in order to facilitate the design and manufacture of the equipment and ensure the accuracy of the test results.