一、前言红外光学系统使用在红外波段,不能直接用人眼观察调试。以往是用可见光模拟的办法间接调试,其结果往往带来代换误差和人的主观因素所产生的误差。并且对于完全不透可见光的红外光学系统用上述方法则无法进行调试。光电法调试是将像点具有的光能通过光敏元件转换成电的信号,根据信号大小可直接调试光学系统。这样可以避免用可见光间接调试所 I. Introduction Infrared optical system used in the infrared band can not be directly observed with the human eye debugging. In the past, the indirect simulation was made by the method of visible light simulation, and as a result, errors caused by substituting errors and subjective factors of people were often brought. And for the fully visible infrared optical system with the above method can not be debugged. Optoelectronic debugging is the point of light energy through the photosensitive element into electrical signals, according to the signal size can be directly debug optical system. This avoids the indirect use of visible light debugging