随着微电子技术的发展,数字集成电路的应用越来越广泛.一般科研机构、院校实验室、工厂和生产单位在使用中经常需要检测集成电路的好坏,而且关键是判断芯片逻辑功能是否损坏,而不是电特性参数.由于TTL数字集成电路种类繁多,因此,如何准确、快速、方便地测出各种芯片逻辑功能的好坏就成了急需解决的问题.国内曾有人介绍过配备微型计算机的测试系统,也有借助单板机配接一些接口电路来进行测 With the development of microelectronic technology, the application of digital integrated circuits is more and more widely.Generally, scientific research institutes, college laboratories, factories and production units often need to test the performance of integrated circuits in use, and the key is to judge the logic function of the chip Is not damaged, rather than the electrical characteristics of the parameters.Due to a wide range of TTL digital integrated circuits, so how to accurately, quickly and easily measure the various logic functions of the chip has become an urgent need to solve the problem. Microcomputer testing system, but also with the board with a number of interface circuit to test