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一般常用的X射线能谱范围内,si(Li)探测器分辨率较晶体分光低一个数量级,谱线的重叠现象更为普遍。如何辨认和处理能谱谱线的重叠是保证能谱分析中定性分析的准确性和减少定量分析误差的关键。尽管采用电子计算机对重叠谱线和各种:干扰因素进行子数学处理和校正,然而在许多情况下还要凭人们的验经作最后的辨认和处理。否则,往往引起漏测元素或把重叠谱线误定为某个元素的特征X射线,从而造成定量分析的误差。
In the commonly used range of X-ray energy spectrum, the resolution of si (Li) detector is one order of magnitude lower than that of crystal and the overlap of spectral lines is more common. How to identify and deal with the overlap of spectral lines is the key to ensure the accuracy of qualitative analysis in energy spectrum analysis and reduce the error of quantitative analysis. Although electronic computers are used to perform sub-math and correction of overlap lines and various interference factors, in many cases the final identification and treatment are based on human experience. Otherwise, it often causes the missing detection element or the overlapping spectrum to be mistakenly identified as the characteristic X-ray of an element, resulting in quantitative analysis error.