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采用单辊熔体旋甩法制备出p型Bi2Te3薄带,研究了退火温度和时间对p型Bi2Te3薄带微结构的影响。结果表明,薄带自由面和接触面的形貌和晶粒尺寸,经过退火处理都发生了变化。当退火温度低于200℃时,退火温度和时间对薄带自由面和接触面的微结构没有明显影响;当退火温度为300℃时,薄带自由面枝状晶和接触面等轴状晶明显长大,且在此温度下,随着退火时间的延长,晶粒进一步长大。
The p-type Bi2Te3 thin ribbons were prepared by a single-roll melt spinning method. The effects of annealing temperature and time on the microstructure of the p-type Bi2Te3 thin ribbons were investigated. The results show that the morphology and grain size of the free surface and the contact surface of the ribbon have been changed after annealing. When the annealing temperature is lower than 200 ℃, the annealing temperature and time have no significant effect on the microstructure of the free surface and the contact surface of the ribbon. When the annealing temperature is 300 ℃, the free surface dendrite and equiaxed crystal Obvious growth, and at this temperature, with the annealing time, the grain grows further.