X射线荧光光谱分析仪器的稳定性,自动化程度及分析速度目前已达到了很高的程度,但是,制样速度太慢,这仍然是个很大的矛盾。制样方法多种多样,其中薄样法被认为是一种简便易行的方法。它的最大特点是基体效应可以忽略,背景低、检出限好、灵敏度高、用样量少,无需特殊的工具。不足之处是分析准确度、重现性不如厚样法。我们用改变游纸片厚度,样品密度及表面光洁度来观察结果的变化,得到了非常有益的结果。并将此方法应用于稀土永磁合金的定量分析。一试验条件仪器:日本理学电机3015x射线衍射-荧光光谱仪薄样:中速定量滤纸,制成φ50mm圆片。测试 The stability, automation and analysis speed of X-ray fluorescence spectrometry equipment have reached a very high level at present. However, the sampling speed is too slow. This is still a very big contradiction. Sample preparation methods varied, including thin sample method is considered to be a simple and easy way. Its most prominent feature is the matrix effect can be neglected, the background is low, the detection limit is good, high sensitivity, with less sample, no special tools. The downside is the accuracy of analysis, reproducibility as thick sample method. We observed the results by changing the thickness of the tourbillon paper, sample density and surface finish, and obtained very beneficial results. And this method is applied to the quantitative analysis of rare earth permanent magnetic alloys. A test conditions Instrument: Japan Science Motor 3015x ray diffraction - fluorescence spectrometer Thin samples: quantitative filter paper in the medium, made of φ50mm wafer. test