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经过史无前例的无产阶级文化大革命,我国各条战线出现一片欣欣向荣的新气象。在毛泽东思想的光辉照耀下,我国电子工业正在飞速发展,各种新型半导体器件不断出现。为了对各种半导体器件特性进行测试,各种测试设备也在不断出现与改进。这里介绍一下晶体管特性曲线图示设备的原理,并对其关键部分,阶梯波发生器与集电极扫描电压发生器作些比较与说明,供有关同志工作中参考。
After the unprecedented proletarian cultural revolution, a new atmosphere of thriving on all fronts in our country has emerged. Under the shining of Mao Zedong Thought, China’s electronics industry is rapidly developing, and various new semiconductor devices are constantly emerging. In order to test the characteristics of various semiconductor devices, a variety of test equipment is also emerging and improving. Here to introduce the principle of the transistor characteristics curve diagram of the device, and the key part of the ladder wave generator and collector scan voltage generator for some comparison and description for the work of the comrades in reference.