一、前言在X射线定量相分析工作中,通常要求样品的厚度应满足“无穷”厚的条件。这是因为在此条件下,应用衍射仪时衍射线强度的吸收因数与θ角无关并等于1/2微米,这就使得在推导定量相分析有关公式时,可以消除掉吸收因数的影响。而在一般情况下,吸收因数是难以准确求出的。在冶金样品的物相分析工作中,常会遇到样品数量很少的情况,我们曾指出,在联用自动可调光栏的条件下,采用极薄平板样品是可能的。文献介绍了直接对比法的应用,但目前K值法采用得更为广 I. Introduction In the work of quantitative analysis of X-ray, it is usually required that the thickness of the sample should meet the condition of “infinite” thickness. This is because under this condition, the absorption factor of the diffraction line intensity when using the diffractometer is independent of the angle θ and is equal to ½ μm, which makes it possible to eliminate the influence of the absorption factor when deriving the formula for quantitative phase analysis. In general, the absorption factor is difficult to find accurately. In the phase analysis of metallurgical samples, we often encounter a small number of samples, we have pointed out that the combination of automatic adjustable light bar conditions, the use of very thin plate samples is possible. The literature describes the application of direct contrast method, but the current K value method is more widely used