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自动测试系统问世后,随着应用的日益广泛,要求自动测试的对象也日趋复杂。例如,对较复杂电子产品的测试,系统中就需要连接多台激励信号源和响应测量仪器,而且除精度和速度的要求外,还有多点、多参量、多功能的要求。由于系统规模的不断扩大,测试复杂程度的提高,一些将激励和测量仪器直接连于被测装置(device under test,缩写为DUT)的简单方法,无法实现系统中各种仪器与DUT之间信号的自动连接和切换。因此必须有一个自动化的开关装置,才能完
After the advent of automatic test system, with the increasingly wide range of applications, the object requires automatic testing is also increasingly complicated. For example, testing of more complex electronic products requires connecting multiple excitation sources and response measuring instruments in the system. In addition to the accuracy and speed requirements, there are multiple, multiple parameters and multi-functional requirements. Due to the ever-expanding system size and the increased complexity of the test, some simple methods of connecting the excitation and measurement instruments directly to the device under test (DUT) can not achieve the signal between the various instruments in the system and the DUT Automatic connection and switching. So there must be an automated switchgear to finish