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在一种基于InGaAs材料的短波红外线列探测器中,光敏元呈品字形排列。在使用该探测器进行推扫成像时,图像中发现了锯齿状的拖影。这种拖影的出现降低了图像的质量。研究发现,串扰是锯齿拖影的成因,而串扰有多种来源,如探测器光敏元的光串或电串、电路的带宽不够等等。为了确定串扰的真正来源,进行了基于平行光管的单光点实验。实验观察了探测器对单光点的响应,实验结果表明这种锯齿拖影是探测器读出电路的带宽不够造成的。在改进了探测器读出电路的性能后,消除了图像中的锯齿拖影。
In an InGaAs-based shortwave infrared detector, the photosensitive elements are arranged in a shape of a letter. When using this detector for push-to-scan imaging, jagged smear was found in the image. The appearance of this smear reduces the quality of the image. The study found that crosstalk is the cause of jagged smear, and crosstalk from a variety of sources, such as the detector light sensor string or string, the circuit bandwidth is not enough and so on. In order to determine the true source of crosstalk, a single light spot experiment based on collimator was performed. The experiment observes the detector response to a single light spot. The experimental results show that this jagged smear is caused by the insufficient bandwidth of the detector readout circuit. After improving the performance of the detector readout circuitry, aliasing in the image is eliminated.