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本文介绍了一种用满足一定条件的俄歇谱线的峰-峰幅度值来研究局域电子态密度的方法。并用此方法研究了成膜原子与衬底原子间的电荷交换行为。结果表明当Cu(Ni)淀积到衬底Ni(Cu)的初期阶段,Ni的部分价带电子转移到Cu中。同样结果也发生在Cu淀积到Mo衬底上的情况。本研究表明,薄膜的一些宏观性质(如膜层和衬底的粘附)可以和微观的现象相联系,而后者可籍助表面科学及其方法进行研究
In this paper, we introduce a method to study the density of local electron states by using the peak-to-peak amplitude of the Auger line satisfying a certain condition. The charge exchange behavior between film-forming atoms and substrate atoms was studied by this method. The results show that when Cu (Ni) is deposited on the initial stage of substrate Ni (Cu), the partial valence band of Ni is transferred into Cu. The same result also occurs when Cu is deposited on a Mo substrate. This study shows that some of the macroscopic nature of the film (such as the adhesion of the film to the substrate) can be related to the microscopic phenomenon that the latter can study with surface-assisted science and its methods