提出了一种选择折叠计数状态转移的BIST方案,它是在基于折叠计数器的基础上,采用LFSR编码折叠计数器种子,并通过选定的存储折叠距离来控制确定的测试模式生成,使得产生的测试模式集与原测试集相等·既解决了测试集的压缩,又克服了不同种子所生成的测试模式之间的重叠、冗余·实验结果证明,建议的方案不仅具有较高的测试数据压缩率,而且能够非常有效地减少测试应用时间,平均测试应用时间仅仅是类似方案的4%· This paper proposes a BIST scheme to choose state transition of folding count. Based on the folding counter, LFSR is used to code folding counter seeds, and the determined test pattern generation is controlled by the selected storage folding distance, so that the generated test The model set is equal to the original test set, which not only solves the compression of the test set but also overcomes the overlap and redundancy between the test patterns generated by different seeds. The experimental results show that the proposed scheme not only has higher test data compression ratio , And can reduce the test application time very effectively, the average test application time is only 4% of the similar solution.