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用透射电子显微镜观察了 Si(113) 衬底上由固态源分子束外延生长的自组织量子点的形貌,测量了其原生及退火后低温下的光荧光谱.对所得结果进行了分析.
The morphology of self-organized quantum dots grown by solid state source molecular beam epitaxy on Si (113) substrate was observed by transmission electron microscope. The fluorescence spectra of the self-assembled quantum dots at the low temperature after annealing were measured. The results were analyzed.