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为了测量喷气箍缩等离子体X射线的空间分辨光谱,利用椭圆聚焦原理,研制了一种椭圆晶体谱仪.分别利用Si(111)、Mica(002)椭圆晶体作色散元件,离心率均为0.9480,布喇格角为30～67.5°,光谱信号采用半径为50mm的半圆形胶片接收,从等离子体源经晶体到胶片的光路长为1430mm.在“阳”加速器装置上进行摄谱验证实验,成功获取了氩喷气等离子体X射线的光谱.测量光谱波长与理论值相符,其中Si弯晶获得的光谱分辨率(λ/Δλ=200～300)低于Mica弯晶获得的光谱分辨率(λ/Δλ=500～700).实验结果表明,该谱仪适合于喷气箍缩等离子体X射线的光谱学研究.
In order to measure the spatially resolved spectrum of jet pinch plasma X-ray, an elliptical crystal spectrometer was developed by using elliptical focusing principle. The eccentric components of Si (111) and Mica (002) , Bragg angle 30 ~ 67.5 °, the spectral signal using a semi-circular film with a radius of 50mm to receive, from the plasma source through the crystal to the film optical path length of 1430mm in the “Yang” accelerator device spectroscopy The results show that the spectral resolution of the Si-bent crystal (λ / Δλ = 200-300) is lower than that obtained by the Mica-bent crystal (Λ / Δλ = 500 ~ 700) .The experimental results show that the spectrometer is suitable for the spectroscopic study of jet pinch plasma X-ray.