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调整双缝干涉实验仪,由于观察和调整手段的局限性及仪器制造精度较低等原因很难达到各光学元件中心共轴,导致从双缝透射出来的光束与遮光管轴线存在一个夹角,以致光束严重偏离测量头。采用光敏电阻测光的方法调整相关光学元件,能使得从双缝透射出来的光束照射到测量头的中心并且达到最亮,从而能够快速调出明亮清晰的干涉条纹,同时能使学生感受到传感器应用的乐趣。
Due to the limitation of observation and adjustment means and the low manufacturing precision of instruments, it is difficult to achieve the coaxial center of each optical element, resulting in the angle between the light beam transmitted from the double slit and the axis of the light-shielding tube. Therefore, As a result, the beam deviates significantly from the measuring head. Photometric resistance photometry method to adjust the relevant optical components, can make the light transmitted from the double slit radiation to the center of the measuring head and the brightest, which can quickly call up bright and clear interference fringes, while enabling students to feel the sensor Application of fun.