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本文叙述了一种当谐振系统中引入摄动以后，量测其谐振频率微小偏移的方法。这 是量测空腔谐振器和慢波系统耦合阻抗时所遇到的主要问题。 所用的方法基于自动频率微调的原理，即利用一套鉴频系统使反射速调管的振荡频 率自动地跟踪到被测腔的谐振频率。然后利用一高精度外差式频率计来测定该振荡系统 的振荡频率和经摄动后的频率偏移 计算和实验表明，用本文所述方法，当被测腔固有品质数为５００～１０００时，在Ｓ 波段可以分辨的最小频偏相对值达１０－５～５×１０－６跟踪误差约为２％。
This paper describes a method for measuring the small offset of the resonant frequency of a resonant system after the introduction of perturbation. This is the main problem encountered when measuring the coupled impedance of cavity resonators and slow-wave systems. The method used is based on the principle of automatic frequency fine tuning, which uses a frequency-discrimination system to automatically track the oscillation frequency of the reflective klystron to the resonant frequency of the cavity under test. Then using a high-precision heterodyne frequency meter to determine the oscillation frequency of the oscillation system and the frequency offset after the perturbation calculation and experiments show that the method described in this article, when the intrinsic quality of the chamber is 500 ~ 1000 , The smallest deviation in the S band can be resolved relative value of 10-5 ~ 5 × 10-6 tracking error of about 2%.