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通过正电子湮没和X—射线衍射对Cu—25.0Zn—4.20Al(Wt％)形状记忆合金母相时效后合金的稳定性进行了研究。结果表明,在第一阶段(10分钟以前)有序度的改变是As上升的主要原因,第二阶段(10分钟到25分钟)过饱和空位的钉扎、聚集起主要作用。
The postablation stability of Cu-25.0Zn-4.20Al (Wt%) shape memory alloy was studied by positron annihilation and X-ray diffraction. The results showed that the change of order degree in the first stage (10 minutes ago) was the main reason for As rising. In the second stage (10 minutes to 25 minutes), pinning of supersaturated vacancies played a major role.