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本文叙述了用电感耦合等离子体原子发射光谱(ICP-AES)进行亚微量样品(<0.5mg)主、次成分分析的新方法。此法在样品及标准溶液中加入相同量的内标元素,即无须准确称量及准确稀释体积。对被测元素的检出限、方法的准确度与精密度、元素间相互干扰的校正等进行了实验。对钴铬薄膜和钐钴铁铜锆永磁合金样品进行了分析,并与常量样品的ICP光谱法及化学法的分析结果进行了比较。该法简便、快速,测定的准确度与精密度均比较满意。
This article describes a new method for the analysis of principal and sub-components of sub-trace samples (<0.5 mg) using inductively coupled plasma atomic emission spectrometry (ICP-AES). This method in the sample and standard solution by adding the same amount of internal standard elements, which do not need accurate weighing and accurate volume dilution. The detection limit of the tested elements, the accuracy and precision of the method, the correction of the mutual interference between elements and so on were tested. The samples of cobalt-chromium film and samarium-cobalt-iron-copper-zirconium permanent magnet alloy were analyzed and compared with the results of ICP spectrometry and chemical analysis of constant samples. The method is simple, rapid, the accuracy and precision of the determination are more satisfied.