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我国自主研制的纳米测长仪和量块快速检测仪两项科技成果不久前通过鉴定。这不仅表明我国微/纳米光电测控技术已处于世界领先水平,而且对解决目前制约我国高新技术和传统制造业发展以及新材料研制过程中的计量问题都具有一定意义。
China’s self-developed nano-length measuring instrument and the rapid detection of the two pieces of scientific and technological achievements recently passed the appraisal. This not only shows that China’s micro / nano photoelectric measurement and control technology is already at the leading level in the world, and it is of great significance to solve the problems currently restricting the development of China’s high-tech and traditional manufacturing industries as well as the measurement of new materials.