论文部分内容阅读
在核物理、表面物理实验和半导体材料研究等工作中,往往要求对某个样品进行定向测量,然后对测得的数据进行分析。为了获得较精确的角度分布,必须对较多的角度点进行测量。实验时不断重复,占用较多实验人员的时间,因此十分需要解决自动测量问题,提高实验工作的效率。 对于自动转角测量来说,可以用随机逻辑设计方案。但是,由于微处理机的出现,提供了更为灵活、方便、可靠、经济的途径,为更进一步的测量自动化及数据分析处理开辟道路。
In the work of nuclear physics, surface physics experiments and semiconductor materials research, it is often required to make a directional measurement of a certain sample, and then analyze the measured data. In order to obtain a more accurate angle distribution, more angle points must be measured. Experiment repeated, occupying more time laborers, it is very necessary to solve the problem of automatic measurement, improve the efficiency of experimental work. For automatic corner measurement, you can use random logic design. However, the advent of microprocessors has provided a more flexible, convenient, reliable and economical way to go further for measurement automation and data analysis.