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现在有很多方法直接从品质指标来选定校正装置,它们在实用计算中是有一定价值的。但已有的基于根轨迹法的直接综合法,有的采用了过于复杂的计算公式,有的需要借助一些曲线族,有的只能根据动态指标要求进行综合,而不能同时根据动态,静态指标进行综合,有的方法局限于某一种特殊校正装置。因此在64年《随动系统》的教学过程中,为了解决教学中的问题,我曾提出一种采
Now there are many ways to choose calibration devices directly from the quality indicators, they are of some value in practical computing. However, the existing direct synthesis method based on the root locus method uses some complicated calculation formulas, some need some curve families, and some can only be synthesized according to the requirements of the dynamic index, not based on the dynamic and static indexes To carry out synthesis, some methods are limited to a particular kind of special correction device. Therefore, in the 64-year “follow-up system” teaching process, in order to solve the teaching problems, I have proposed a mining