近年来，随着半导体薄膜外延技术的发展，低维半导体材料结构，特别是半导体量子线、量子点的制备己成为可能．与体结构材料相比，低维结构材料具有许多优越的性质和它所具有的深刻的物理内涵，己成为半导体物理研究的热点之一． 利用光伏效应测量半导体材料的性质已是一种成熟 In recent years, with the development of semiconductor thin film epitaxy technology, low-dimensional semiconductor material structure, especially the semiconductor quantum wire, quantum dot preparation has become possible. Compared with bulk materials, low-dimensional materials have many superior properties and it has the profound physical connotation, has become one of the hot spots in semiconductor physics research. The use of photovoltaic effect measurement of the properties of semiconductor materials is a mature