眼底周边部的压陷检查法是近年来裂隙灯显微镜检查法的新发展。利用压陷接触镜可以检查限底周边部,包括锯齿缘附近的视网膜、睫状体和玻璃体基础邰。这样,除了虹膜的后表面以外,全部眼球则都可以用裂隙灯显微镜检查了。因为临床上有许多病理情况是发生在眼底的周边部,所以这种检查方法对早期诊断和治疗都有很大的价值。 The subsidence examination of the peripheral portion of the fundus is a new development of the slit lamp microscopy in recent years. The crimp contact lens allows inspection of the perimeter of the culet, including the retina, ciliary body, and vitreous base adjacent to the serrated edge. Thus, with the exception of the posterior surface of the iris, all eyeballs can be examined by slit-lamp microscopy. Because there are many clinical pathological conditions occur in the periphery of the fundus, so this method of examination for early diagnosis and treatment are of great value.