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为了解决模拟和数模混合电路芯片可测性设计问题,IEEE成立了IEEE P1149.4工作组。本文介绍了IEEE P1149.4数模混合信号测试总线的基本结构,以及应用该总线对模拟器件进行测试的方法。
In order to solve the design problem of the testability of the analog and digital-to-analog hybrid chips, IEEE established the IEEE P1149.4 working group. This paper introduces the basic structure of the IEEE P1149.4 digital-to-analog mixed signal test bus and the method of testing the analog devices using this bus.