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由于采用新的设计以及金属化系统的改进,微波功率晶体管的平均失效时间正在增加。本文就长期和短期可靠性问题以及它们之间的相互关系作一评远。
The average failure time of microwave power transistors is increasing due to the new design and improvements in the metallization system. This article provides a long-term and short-term reliability issue and their interrelations.