论文部分内容阅读
给出了多维正态分布与x~2分布的概率性质,讨论了在小样本检验中如何检验同方差的二维正态分布 的方差问题。给出了检验中所涉及到的拒真和纳伪概率的重要物理参数和OC曲线。该结论在武器装备小样本检 验中具有重要的意义。
The probability properties of multidimensional normal distribution and x ~ 2 distribution are given, and how to test the variance of two-dimensional normal distribution with the same variance is discussed in the small sample test. The important physical parameters and OC curves are given for the refusal and naive probabilities involved in the test. This conclusion is of great significance in the small sample test of weapons and equipment.