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研究了碳纤维和碳-碳复合材料透射电镜样品制备技术。超薄切片法具有很多优点,并与离子轰击法进行了比较。用金刚石刀超薄切片法制备的薄膜样品电子透明度高,平行度好,而且具有清洁的表面。并对在电镜观察中识别在薄膜的制备过程中引入的假象做了分析。
The preparation of TEM and carbon-carbon composite materials by TEM was studied. Slim slicing has many advantages and is compared with ion bombardment. Thin films prepared by ultrasonically slicing with a diamond knife have high electron transparency, good parallelism and a clean surface. The analysis of the illusion introduced during the preparation of the thin film by electron microscopy was analyzed.