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本文采用 Mason 电击穿公式,用一个简单的数字模型,对电化蚀刻过程中固体径迹探测器记录粒子径迹的相对灵敏度 S 与外加电场强度 E 的关系及其它有关参数的影响进行了研究。计算了 CR-39电化蚀刻的 S-E 曲线,并与一些作者的实验结果作了比较。
In this paper, we use the Mason electric breakdown formula and use a simple numerical model to study the relationship between the relative sensitivity S and the applied electric field E and the influence of other related parameters of the solid track detector during electrochemical etching. The S-E curve of CR-39 electrochemical etching was calculated and compared with the experimental results of some authors.