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随着国民经济和国防工业的发展,晶体管和集成电路的使用越来越普遍。与此同时,关于它们的可靠性问题,日益引起人们的重视。可靠性筛选是提高可靠性的重要措施。本文讨论了硅平面半导体器件的可靠性筛选的几个基本问题。
With the development of national economy and national defense industry, the use of transistors and integrated circuits is becoming more and more common. At the same time, increasing attention has been paid to their reliability issues. Reliability screening is an important measure to improve reliability. This article discusses several basic issues for reliability screening of silicon planar semiconductor devices.