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运算放大器共模拟制比K_(CMR)的测试,IEC(国际电工委员会)测试标准允许使用二种方法,即常规法和变电源法.常规法(见图1)对电阻匹配精度要求过高,约10~5～10~6变电源法(见图2)存在差模相差问题,即电源内阻r和滤波电容c造成了相称两电流的差异.因此要求τ/T≤1(τ=rc,T为信号周期).而且,此方法还要求电源浮地.可否寻求一种新的测试方法,能兼扬两者之长,皆避两者之短呢?为此,首先要从理论上分析器件共模特性
Operational amplifier common mode ratio K_ (CMR) test, IEC (International Electrotechnical Commission) test standard allows the use of two methods, that is, conventional and variable power method. Conventional method (see Figure 1) on the resistance matching accuracy is too high, About 10 ~ 5 ~ 10 ~ 6 variable power method (see Figure 2) there is a difference between the differential mode, that is, the power supply resistance r and the filter capacitor c caused by the difference between the two currents.Therefore, the required τ / T ≤ 1 (τ = rc , T is the signal period.) Moreover, this method also requires the power floating. Can you find a new test method that can both long and short, both avoid short? To do this, we must first theoretically Analyze the common-mode characteristics of the device