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晶体半导体公司研制了分辨率为16位、最大转换速度50k次/秒的A/D转换器和分辨率为12位、最大转换速度1M次/秒的A/D转换器LSI。这两种A/D转换器LSI都具有自校准非线性误差的功能,这种功能可调整与各位相对应的2~N(N是位数)个加权电容器的电容比。各位的电容器由偶数个小容量电容器构成,改变电容器数量的同时即可进行校准。用集成在芯片上的微计算机控制校准操作,可以使LSI制造过程中的试验变得简单。即使在用户正在使用着的系统上也能够自动进行校准,因而对温度变化和时效变化也能够进行补偿。
Crystal Semiconductor has developed an A / D converter with a resolution of 16 bits and a maximum conversion speed of 50k times / second, and an A / D converter LSI with a resolution of 12 bits and a maximum conversion speed of 1M times / second. Both of these A / D converter LSIs have a self-calibration non-linearity error function that adjusts the capacitance ratio of 2 to N (N is the number of bits) of the weighted capacitors corresponding to each bit. Each capacitor is composed of an even number of small-capacity capacitors that can be calibrated while changing the number of capacitors. Microcontroller-integrated calibration operations integrated on-chip make it easy to test LSI manufacturing processes. The calibration is automatically performed even on the system the user is using, so that changes in temperature and aging can be compensated for.