用电子背散射衍射（ Ｅ Ｂ Ｓ Ｄ）技术可以分别对试样中不同类型的晶粒，测定其显微织构。当 Ｅ Ｂ Ｓ Ｄ 附件只能给出显微织构的极图、反极图和每一晶粒的欧拉角时，本文介绍了如何编写计算机程序由欧拉角数据获取取向分布函数（ Ｏ Ｄ Ｆ）。当试样在扫描电镜中的放置方位不同于仪器所规定的标准放置方位时，本文介绍了如何由仪器给出的欧拉角计算出对应于非标准放置的试样的欧拉角，并进而获取 Ｏ Ｄ Ｆ的方法。 The electron backscatter diffraction (E B S D) technique can separate the different types of grains in the sample and measure the microstructure. When the E B S D annex gives only the pole figure, the anti-pole figure and the Euler angles of each grain, we introduce how to write a computer program to obtain the orientation distribution function (O D F). When the orientation of the specimen in the SEM is different from that of the instrument, this paper describes how to calculate the Euler angle of the specimen corresponding to the non-standard position and then Get O D F’s method.