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X射线光谱议是一种强有力的激光等离子体诊断工具。为了获取激光等离子体发射的X射线中所包含大量信息,基于椭圆几何原理设计制造了X射线弯晶谱议。在上海神光 号装置上利用LiF弯曲晶体分析器,用150J激光能量对Ti靶进行了试验。通过X射线CCD记录获取的谱线,结果表明这种聚焦型晶体分析器的灵敏度有了明显的提高。
X-ray spectrometry is a powerful laser plasma diagnostic tool. In order to obtain a large amount of information contained in the X-rays emitted by the laser plasma, X-ray crystal bending spectroscopy was designed and manufactured based on the elliptical geometry principle. LiF bending crystal analyzer was used in Shanghai ShenGuang device to test Ti target with 150J laser energy. The acquired spectra were recorded by an X-ray CCD and the results showed that the sensitivity of this focusing type crystal analyzer has been significantly improved.