电淀积工艺制备 CdSe_xTe_(1-x)薄膜,经 x 射线衍射分析,肯定薄膜是以 CdSe 为基的三元单相固溶体,其结构并非严格的立方闪锌矿结构,应属正交晶系;随着退火温度升高正交性不断加强,高温700℃退火除正交性加剧外,还出现许多新谱线,它与六角闪锌矿结构不符而与正交结构的超点阵结构谱线吻合;这种情况的出现可能与 Te 和 Se 原子有规则占据四面体间隙位置引起长程有序化有关。 CdSe_xTe_ (1-x) thin films were prepared by electrodeposition and confirmed by X-ray diffraction. It was confirmed that the films were based on CdSe ternary single phase solid solution and the structure was not strictly cubic sphalerite and should be orthorhombic ; With the increasing of the annealing temperature, the orthogonality is strengthened. In addition to the increased orthogonality, there are many new spectra at high temperature annealing at 700 ℃, which is not consistent with the structure of hexagonal sphalerite and the orthorhombic structure spectrum The occurrence of this situation may be related to the long-range ordering of regular occupation of tetrahedral interstices between Te and Se atoms.