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分别采用Χ射线衍射 (XRD)、俄歇电子谱 (AES)、Χ射线光电与谱 (XPS)研究喷涂烧结 Cd S(Se)薄膜在有氮气氛下热退火前后的结构 .并进一步研究了镉和硫化学态对表面层氧成分的影响 .结果表明 ,表现几个原子层范围内的 Cd S(Se)膜的非化学计量组成和 Cd O降低了薄膜的光电性能和寿命
The structures of spray-sintered Cd S (Se) thin films before and after thermal annealing in a nitrogen atmosphere were investigated by X-ray diffraction (XRD), Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy and XPS. And sulfur states on the oxygen content of the surface layer.The results show that the non-stoichiometric composition and Cd O of CdS (Se) films in several atomic layers decrease the optical and electrical properties and lifetime